標題: Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO(3) Thin Films
作者: Damodaran, Anoop R.
Liang, Chen-Wei
He, Qing
Peng, Chun-Yen
Chang, Li
Chu, Ying-Hao
Martin, Lane W.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 26-七月-2011
摘要: The presence of a variety of structural variants in BiFeO(3) thin films give rise to exotic electric-field-induced responses and resulting electromechanical responses as large as 5%. Using high-resolution X-ray diffraction and scanning-probe-microscopy-based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral- and tetragonal-like phases, is discovered.
URI: http://dx.doi.org/10.1002/adma.201101164
http://hdl.handle.net/11536/21394
ISSN: 0935-9648
DOI: 10.1002/adma.201101164
期刊: ADVANCED MATERIALS
Volume: 23
Issue: 28
起始頁: 3170
結束頁: +
顯示於類別:期刊論文