標題: Design of Dual-Band ESD Protection for 24-/60-GHz Millimeter-Wave Circuits
作者: Chu, Li-Wei
Lin, Chun-Yu
Ker, Ming-Dou
電子工程學系及電子研究所
光電工程學系
顯示科技研究所
Department of Electronics Engineering and Institute of Electronics
Department of Photonics
Institute of Display
關鍵字: CMOS;dual-band;electrostatic discharge (ESD) protection;millimeter-wave (MMW);radio frequency (RF)
公開日期: 1-三月-2013
摘要: To effectively protect the millimeter-wave (MMW) circuits in nanoscale CMOS technology from electrostatic discharge (ESD) damages, a dual-band ESD protection cell for 24-/60-GHz ESD protection is presented in this paper. The proposed ESD protection cell consisted of a diode, a silicon-controlled rectifier, a PMOS, and two inductors. To verify the dual-band characteristics and ESD robustness, the proposed ESD protection circuit had been applied to a 24-/60-GHz low-noise amplifier (LNA). The measurement results showed over-2-kV human-body-model ESD robustness with little performance degradation on LNA. The proposed dual-band ESD protection cell was suitable for circuit designers for them to easily apply ESD protection in the dual-band MMW circuits.
URI: http://dx.doi.org/10.1109/TDMR.2012.2217498
http://hdl.handle.net/11536/21409
ISSN: 1530-4388
DOI: 10.1109/TDMR.2012.2217498
期刊: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume: 13
Issue: 1
起始頁: 110
結束頁: 118
顯示於類別:期刊論文


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