標題: | Loycal atomic and electronic structures and ferroelectric properties of PbZr(0.52)Ti(0.48)O(3): An x-ray absorption study |
作者: | Ray, S. C. Hsueh, H. C. Wu, C. H. Pao, C. W. Asokan, K. Liu, M. T. Tsai, H. M. Chuang, C. H. Pong, W. F. Chiou, J. W. Tsai, M. -H. Lee, J. M. Jang, L. Y. Chen, J. M. Lee, J. F. 電子物理學系 Department of Electrophysics |
公開日期: | 25-七月-2011 |
摘要: | This work investigates local atomic and electronic structures of PbZr(0.52)Ti(0.48)O(3) (PZT) thin films with < 001 >, < 101 >, and < 111 > orientations using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near-edge structure (XANES) spectroscopy with theta = 0 degrees and 70 degrees incident angles. The EXAFS result indicates that the < 001 >-oriented PZT film has a polarization dominantly along the c-axis, while both < 101 >- and < 111 >-oriented PZT films have a dominant in-ab-plane polarization. The hysteresis-loop measurements show that the < 001 >-oriented PZT film has a much larger coercive field than those of other two PZT films, which indicates that the double-well potential along the c-axis is much deeper than that in the ab-plane. (C) 2011 American Institute of Physics. [doi:10.1063/1.3607475] |
URI: | http://dx.doi.org/10.1063/1.3607475 http://hdl.handle.net/11536/21416 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.3607475 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 99 |
Issue: | 4 |
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顯示於類別: | 期刊論文 |