標題: Loycal atomic and electronic structures and ferroelectric properties of PbZr(0.52)Ti(0.48)O(3): An x-ray absorption study
作者: Ray, S. C.
Hsueh, H. C.
Wu, C. H.
Pao, C. W.
Asokan, K.
Liu, M. T.
Tsai, H. M.
Chuang, C. H.
Pong, W. F.
Chiou, J. W.
Tsai, M. -H.
Lee, J. M.
Jang, L. Y.
Chen, J. M.
Lee, J. F.
電子物理學系
Department of Electrophysics
公開日期: 25-Jul-2011
摘要: This work investigates local atomic and electronic structures of PbZr(0.52)Ti(0.48)O(3) (PZT) thin films with < 001 >, < 101 >, and < 111 > orientations using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near-edge structure (XANES) spectroscopy with theta = 0 degrees and 70 degrees incident angles. The EXAFS result indicates that the < 001 >-oriented PZT film has a polarization dominantly along the c-axis, while both < 101 >- and < 111 >-oriented PZT films have a dominant in-ab-plane polarization. The hysteresis-loop measurements show that the < 001 >-oriented PZT film has a much larger coercive field than those of other two PZT films, which indicates that the double-well potential along the c-axis is much deeper than that in the ab-plane. (C) 2011 American Institute of Physics. [doi:10.1063/1.3607475]
URI: http://dx.doi.org/10.1063/1.3607475
http://hdl.handle.net/11536/21416
ISSN: 0003-6951
DOI: 10.1063/1.3607475
期刊: APPLIED PHYSICS LETTERS
Volume: 99
Issue: 4
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