標題: Coaxial-structured ZnO/silicon nanowires extended-gate field-effect transistor as pH sensor
作者: Li, Hung-Hsien
Yang, Chi-En
Kei, Chi-Chung
Su, Chung-Yi
Dai, Wei-Syuan
Tseng, Jung-Kuei
Yang, Po-Yu
Chou, Jung-Chuan
Cheng, Huang-Chung
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Extended-Gate Field-Effect Transistors (EGFET);pH sensor;Zinc oxide (ZnO);Atomic layer deposition (ALD);Electroless metal deposition (EMD);Low temperature
公開日期: 1-Feb-2013
摘要: An extended-gate field-effect transistor (EGFET) of coaxial-structured ZnO/silicon nanowires as pH sensor was demonstrated in this paper. The oriented 1-mu m-long silicon nanowires with the diameter of about 50 nm were vertically synthesized by the electroless metal deposition method at room temperature and were sequentially capped with the ZnO films using atomic layer deposition at 50 degrees C. The transfer characteristics (I-DS-V-REF) of such ZnO/silicon nanowire EGFET sensor exhibited the sensitivity and linearity of 46.25 mV/pH and 0.9902, respectively for the different pH solutions (pH 1-pH 13). In contrast to the ZnO thin-film ones, the ZnO/silicon nanowire EGFET sensor achieved much better sensitivity and superior linearity. It was attributed to a high surface-to-volume ratio of the nanowire structures, reflecting a larger effective sensing area. The output voltage and time characteristics were also measured to indicate good reliability and durability for the ZnO/silicon nanowires sensor. Furthermore, the hysteresis was 9.74 mV after the solution was changed as pH 7 -> pH 3 -> pH 7 -> pH 11 -> pH 7. (C) 2012 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.tsf.2012.05.045
http://hdl.handle.net/11536/21450
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.05.045
期刊: THIN SOLID FILMS
Volume: 529
Issue: 
起始頁: 173
結束頁: 176
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