完整後設資料紀錄
DC 欄位語言
dc.contributor.authorWu, Wang-Tsungen_US
dc.contributor.authorHsieh, Hung-Chihen_US
dc.contributor.authorChang, Wei-Yaoen_US
dc.contributor.authorChen, Yen-Liangen_US
dc.contributor.authorSu, Der-Chinen_US
dc.date.accessioned2014-12-08T15:30:03Z-
dc.date.available2014-12-08T15:30:03Z-
dc.date.issued2011-07-20en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://dx.doi.org/10.1364/AO.50.004011en_US
dc.identifier.urihttp://hdl.handle.net/11536/21526-
dc.description.abstractIn a modified Twyman-Green interferometer, the optical path variation is measured with the heterodyne central fringe identification technique, as the light beam is focused by a displaced microscopic objective on the front/rear surface of the test transparent plate. The optical path length variation is then measured similarly after the test plate is removed. The geometrical thickness of the test plate can be calculated under the consideration of dispersion effect. This method has a wide measurable range and a high accuracy in the measurable range. (c) 2011 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleHigh-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/AO.50.004011en_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume50en_US
dc.citation.issue21en_US
dc.citation.spage4011en_US
dc.citation.epage4016en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000292970600033-
dc.citation.woscount3-
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