Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, Yen-Hung | en_US |
dc.contributor.author | Yu, Bei | en_US |
dc.contributor.author | Pan, David Z. | en_US |
dc.contributor.author | Li, Yih-Lang | en_US |
dc.date.accessioned | 2014-12-08T15:30:08Z | - |
dc.date.available | 2014-12-08T15:30:08Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.isbn | 978-1-4503-1573-9 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21593 | - |
dc.description.abstract | TPL-friendly detailed routers require a systematic approach to detect TPL conflicts. However, the complexity of conflict graph (CG) impedes directly detecting TPL conflicts in CG. This work proposes a token graph-embedded conflict graph (TECG) to facilitate the TPL conflict detection while maintaining high coloring-flexibility. We then develop a TPL aware detailed router (TRIAD) by applying TECG to a gridless router with the TPL stitch generation. Compared to a greedy coloring approach, experimental results indicate that TRIAD generates no conflicts and few stitches with shorter wirelength at the cost of 2.41 x of runtime. | en_US |
dc.language.iso | en_US | en_US |
dc.title | TRIAD: A Triple Patterning Lithography Aware Detailed Router | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2012 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) | en_US |
dc.citation.spage | 123 | en_US |
dc.citation.epage | 129 | en_US |
dc.contributor.department | 資訊工程學系 | zh_TW |
dc.contributor.department | Department of Computer Science | en_US |
dc.identifier.wosnumber | WOS:000317001300018 | - |
Appears in Collections: | Conferences Paper |