Title: An application of non-normal process capability indices
Authors: Chen, KS
Pearn, WL
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: process capability index;process mean;process standard deviation;percentile
Issue Date: 1-Nov-1997
Abstract: Numerous process capability indices, including C-p, C-pk, C-pm, and C-pmk, have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory. (C) 1997 John Wiley & Sons, Ltd.
URI: http://hdl.handle.net/11536/215
ISSN: 0748-8017
Journal: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 13
Issue: 6
Begin Page: 355
End Page: 360
Appears in Collections:Articles


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