標題: | Growth and characterization of topological insulator Bi2Se3 thin films on SrTiO3 using pulsed laser deposition |
作者: | Phuoc Huu Le Wu, Kaung Hsiung Luo, Chih Wei Leu, Jihperng 材料科學與工程學系 電子物理學系 Department of Materials Science and Engineering Department of Electrophysics |
關鍵字: | Bi2Se3;Topological insulator;Thin film;Pulsed laser deposition;SrTiO3 substrate |
公開日期: | 1-五月-2013 |
摘要: | Bismuth selenide (Bi2Se3) thin films were grown on SrTiO3(111) (STO) substrates using pulsed laser deposition (PLD). The structural, morphological, electrical, and transport properties were studied at various substrate temperatures (T-S) from 120 to 350 degrees C. Amorphous films grown at T-S < 180 degrees C exhibited semiconducting behavior, and highly c-axis-oriented textured films deposited at T-S >= 180 degrees C exhibited metallic behavior. Bi2Se3 thin-films were epitaxially grown on STO substrates at 300 and 350 degrees C. Thickness-dependent characteristics were also investigated for optimized Bi2Se3 films deposited at T-S = 230 degrees C. The semiconducting or metallic characteristics of Bi2Se3 films prepared using PLD were observed through electrical and transport results. (C) 2013 Elsevier B. V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.tsf.2013.01.104 http://hdl.handle.net/11536/21653 |
ISSN: | 0040-6090 |
DOI: | 10.1016/j.tsf.2013.01.104 |
期刊: | THIN SOLID FILMS |
Volume: | 534 |
Issue: | |
起始頁: | 659 |
結束頁: | 665 |
顯示於類別: | 期刊論文 |