Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sun, Y. -C. | en_US |
| dc.contributor.author | Tsai, W. -J. | en_US |
| dc.date.accessioned | 2014-12-08T15:30:26Z | - |
| dc.date.available | 2014-12-08T15:30:26Z | - |
| dc.date.issued | 2013-01-17 | en_US |
| dc.identifier.issn | 0013-5194 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1049/el.2012.2470 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/21764 | - |
| dc.description.abstract | Unequal error protection extensions of low density parity check accumulate (UEP-LDPCA) codes are discussed and several potential applications are proposed. Two UEP-LDPCA schemes are analysed and code parameters are optimised using a density evolution algorithm. Simulation results show that the extensions have the significant unequal error protection property. This activates new directions for existing applications. | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Analysis of unequal error protection for LDPCA codes | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | 10.1049/el.2012.2470 | en_US |
| dc.identifier.journal | ELECTRONICS LETTERS | en_US |
| dc.citation.volume | 49 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 102 | en_US |
| dc.citation.epage | 103 | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.identifier.wosnumber | WOS:000318238000014 | - |
| dc.citation.woscount | 0 | - |
| Appears in Collections: | Articles | |
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