The Effect of Silicon Oxide Based RRAM with Tin Doping (vol 15, pg H65, 2012)

Title:	The Effect of Silicon Oxide Based RRAM with Tin Doping (vol 15, pg H65, 2012)
Authors:	Chang, Kuan-Chang Tsai, Tsung-Ming Chang, Ting-Chang Syu, Yong-En Liao, Kuo-Hsiao Chuang, Siang-Lan Li, Cheng-Hua Gan, Der-Shin Sze, Simon M. 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	2012
URI:	http://hdl.handle.net/11536/21802 http://dx.doi.org/10.1149/2.022202ssl
ISSN:	2162-8742
DOI:	10.1149/2.022202ssl
Journal:	ECS SOLID STATE LETTERS
Volume:	1
Issue:	2
Begin Page:	X1
End Page:	X1
Appears in Collections:	Articles

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