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dc.contributor.authorPanda, Debashisen_US
dc.contributor.authorTseng, Tseung-Yuenen_US
dc.date.accessioned2014-12-08T15:30:56Z-
dc.date.available2014-12-08T15:30:56Z-
dc.date.issued2013-10-01en_US
dc.identifier.issn0022-2461en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10853-013-7541-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/22088-
dc.description.abstractOne-dimensional (1D) zinc oxide (ZnO) nanostructures have been extensively and intensively studied for several decades not only for their extraordinary chemical and physical properties, but also for their current and future different electronic and optoelectronic device applications. This review provides a brief overview of the progress of different synthesis methods and applications of 1D-ZnO nanostructures. Morphology of ZnO nanostructures grown by various methods and progress in the optical properties are briefly described. Using low-temperature photoluminescence (LTPL) study, detailed informations about the defect states and impurity of such nanostructures are reported. Improvement of field emission properties by modifying the edge of 1D-ZnO nanostructures is briefly discussed. Applications such as different sensors, field effect transistor, light-emitting diodes (LEDs), and photodetector are briefly reviewed. ZnO has large exciton binding energy (60 meV) and wide band gap (3.37 eV), which could lead to lasing action based on exciton recombination. As semiconductor devices are being aggressively scaled down, ZnO 1D nanostructures based resistive switching (RS) memory (resistance random access memory) is very attractive for nonvolatile memory applications. Switching properties and mechanisms of Ga-doped and undoped ZnO nanorods/NWs are briefly discussed. The present paper reviews the recent activities of the growth and applications of various 1D-ZnO nanostructures for sensor, LED, photodetector, laser, and RS memory devices.en_US
dc.language.isoen_USen_US
dc.titleOne-dimensional ZnO nanostructures: fabrication, optoelectronic properties, and device applicationsen_US
dc.typeReviewen_US
dc.identifier.doi10.1007/s10853-013-7541-0en_US
dc.identifier.journalJOURNAL OF MATERIALS SCIENCEen_US
dc.citation.volume48en_US
dc.citation.issue20en_US
dc.citation.spage6849en_US
dc.citation.epage6877en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000322277700001-
dc.citation.woscount8-
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