標題: A Close Form Solution for the Product Acceptance Determination Based on the Popular Index C-pk
作者: Pearn, W. L.
Wu, C. H.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: critical acceptance value;multiple characteristics;product acceptance determination;required sample size
公開日期: 1-Jul-2013
摘要: Product acceptance determinations are practical tools for quality control applications involving quality contract on product orders between the vendor and the buyer. It provides the vendor and the buyer rules for product acceptance to meet the preset product quality requirement. As the rapid advancement of manufacturing technology, more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we introduce an efficient product acceptance procedure on the basis of the generalization C-pk(T) index, to deal with lot sentencing problem with very low fraction of defectives. We tabulate the required sample size n and the corresponding critical acceptance value c(0) for various alpha-risk, beta-risk, and the levels of the lot fraction of defectives that correspond to acceptance and rejecting quality levels. Practitioners can use the proposed method to make reliable decisions in product acceptance. Copyright (C) 2012 John Wiley & Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.1423
http://hdl.handle.net/11536/22220
ISSN: 0748-8017
DOI: 10.1002/qre.1423
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 29
Issue: 5
起始頁: 719
結束頁: 723
Appears in Collections:Articles


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