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dc.contributor.authorTojo, Yosukeen_US
dc.contributor.authorMiura, Atsushien_US
dc.contributor.authorIshikawa, Yasuakien_US
dc.contributor.authorYamashita, Ichiroen_US
dc.contributor.authorUraoka, Yukiharuen_US
dc.date.accessioned2014-12-08T15:31:14Z-
dc.date.available2014-12-08T15:31:14Z-
dc.date.issued2013-07-01en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2013.06.006en_US
dc.identifier.urihttp://hdl.handle.net/11536/22244-
dc.description.abstractCrystallization employing an N-(2-aminoethyl)-3-aminopropyltrimethoxysilane self-assembled monolayer (AEAPS-SAM) to coordinate Ni metal catalyst was found to produce large grain poly-Si. A small concentration of Ni could be deposited controllably onto an AEAPS-SAM covered with Si by immersing it in Ni solution for 1-60 min. Larger grains and a lower Ni concentration in the poly-Si could be obtained by shorter immersion. Immersion for 1 min produced grains, as large as 47 mu m and a Ni concentration as low as 7.4 x 10(18) atoms/cm(3). A poly-Si thin-film transistor fabricated with AEAPS-SAMpoly-Si of 1 min immersion had a field-effect mobility of 98 cm(2)/(V s), which is one order of magnitude higher than that of a thin-film transistor fabricated without the AEAPS-SAM treatment. (C) 2013 Elsevier B. V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectPolycrystalline siliconen_US
dc.subjectN-(2-aminoethyl)-3-aminopropyltrimethoxysilaneen_US
dc.subjectSelf-assembled monolayersen_US
dc.subjectMetal-induced lateral crystallizationen_US
dc.subjectThin-film transistorsen_US
dc.titlePolycrystalline silicon thin-film transistor utilizing self-assembled monolayer for crystallizationen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.tsf.2013.06.006en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume540en_US
dc.citation.issueen_US
dc.citation.spage266en_US
dc.citation.epage270en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.department應用化學系分子科學碩博班zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.contributor.departmentInstitute of Molecular scienceen_US
dc.identifier.wosnumberWOS:000321437400043-
dc.citation.woscount2-
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