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dc.contributor.authorLi, Yimingen_US
dc.contributor.authorChen, Ying-Chiehen_US
dc.date.accessioned2014-12-08T15:31:15Z-
dc.date.available2014-12-08T15:31:15Z-
dc.date.issued2013-07-01en_US
dc.identifier.issn0895-7177en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.mcm.2012.11.002en_US
dc.identifier.urihttp://hdl.handle.net/11536/22255-
dc.description.abstractWe study one-dimensional doping profile design optimization problem of metal-oxide-semiconductor (MOS) devices using a geometric programming (GP) technique. To model the explored optimal doping profile into a GP problem, the subthreshold swing is formulated as an objective function and the on- and off-state currents are considered as constraints for solving the corresponding optimal doping profile. The GP problem is a special type of convex optimization and is solved globally and efficiently using the existing numerical solvers in GGPLAB. The accuracy of optimized results is validated by comparing with numerical semiconductor device simulation. This approach provides a way to optimize doping problem which may benefit manufacturing of MOS devices. (C) 2012 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectDoping profileen_US
dc.subjectDesign optimizationen_US
dc.subjectGeometric programmingen_US
dc.subjectMOS devicesen_US
dc.titleGeometric programming approach to doping profile design optimization of metal-oxide-semiconductor devicesen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.mcm.2012.11.002en_US
dc.identifier.journalMATHEMATICAL AND COMPUTER MODELLINGen_US
dc.citation.volume58en_US
dc.citation.issue1-2en_US
dc.citation.spage344en_US
dc.citation.epage354en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000320601000035-
dc.citation.woscount1-
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