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dc.contributor.authorWu, Yin-Haoen_US
dc.contributor.authorLee, Chuo-Hanen_US
dc.contributor.authorChu, Chung-Mingen_US
dc.contributor.authorYeh, Yen-Hsienen_US
dc.contributor.authorChen, Chan-Linen_US
dc.contributor.authorLee, Wei-Ien_US
dc.date.accessioned2014-12-08T15:31:58Z-
dc.date.available2014-12-08T15:31:58Z-
dc.date.issued2013-08-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.52.08JB08en_US
dc.identifier.urihttp://hdl.handle.net/11536/22578-
dc.description.abstractA-plane GaN was grown on r-plane sapphire using a two-step growth method by hydride vapor phase epitaxy (HVPE). In the first step, a-plane GaN formed triangular stripes along the m-direction ([(1) over bar 100] direction) at a low growth temperature. Then, increasing the growth temperature enhanced the lateral growth mode to coalesce a-plane GaN in the second step. There were triangular voids formed after growth. In this work, a new method was developed to produce the voids in the a-plane GaN film using the two-step growth method without optical lithography. (C) 2013 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleA Simple Growth Method to Produce a-Plane GaN Thick Films by Hydride Vapor Phase Epitaxyen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/JJAP.52.08JB08en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume52en_US
dc.citation.issue8en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000323883100017-
dc.citation.woscount0-
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