完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.contributor.author | Chiu, Po-Yen | en_US |
dc.date.accessioned | 2014-12-08T15:32:16Z | - |
dc.date.available | 2014-12-08T15:32:16Z | - |
dc.date.issued | 2013-10-01 | en_US |
dc.identifier.issn | 1549-8328 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TCSI.2013.2244351 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/22696 | - |
dc.description.abstract | A new 2 x V-DD-tolerant input/output (I/O) buffer with process, voltage, and temperature (PVT) compensation is proposed and verified in a 90-nm CMOS process. Consisting of the dynamic source bias and gate controlled technique, the proposed mixed-voltage I/O buffer realized by only 1xV(DD) devices can successfully transmit and receive 2 x V-DD signal. Utilizing this technique with only 1xV(DD) devices, the digital logic gates are also modified to have 2xV(DD)-tolerant capability. With 2xV(DD)-tolerant logic gates, the PVT variation detector has been implemented to detect PVT variations from 2 x V-DD signal and provide compensation control to the 2 x V-DD-tolerant I/O buffer without suffering the gate-oxide overstress issue. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Gate-oxide overstress | en_US |
dc.subject | mixed-voltage I/O buffer | en_US |
dc.subject | process, voltage, and temperature (PVT) variation | en_US |
dc.title | Design of 2 x V-DD-Tolerant I/O Buffer With PVT Compensation Realized by Only 1 x V-DD Thin-Oxide Devices | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TCSI.2013.2244351 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | en_US |
dc.citation.volume | 60 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 2549 | en_US |
dc.citation.epage | 2560 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | 生醫電子轉譯研究中心 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.contributor.department | Biomedical Electronics Translational Research Center | en_US |
dc.identifier.wosnumber | WOS:000325225700001 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |