标题: | CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate |
作者: | Chang, Austin C. -C. Huang, Ryan H. -M. Wen, Charles H. -P. 電機資訊學士班 Undergraduate Honors Program of Electrical Engineering and Computer Science |
关键字: | Reliability;single event upset;statistical SER (SSER);statistical static timing analysis (SSTA);transient fault |
公开日期: | 1-十月-2013 |
摘要: | CMOS designs in the deep submicrometer era require statistical methods to accurately estimate the circuit soft error rate (SER). However, process variation increases the complexity of statistical characteristics related to transient faults, leading to considerable uncertainty in the behavior of soft errors. Regardless of the methods used, current statistical SER (SSER) frameworks invariably involve a tradeoff between accuracy and efficiency. This paper presents accurate cell models in first-order closed form to overcome this problem, thereby enabling the analysis of SSERs in a block-based fashion similar to statistical static timing analysis. These cell models are derived as a closed form in the proposed framework named CASSER, and remain precise under the assumption of a normal distribution for the process parameters. Experimental results demonstrate the efficiency (> 2-order times faster than the latest framework) and accuracy (< 3% error) of CASSER in estimating circuit SERs, when compared with the Monte Carlo SPICE simulation. |
URI: | http://dx.doi.org/10.1109/TVLSI.2012.2220386 http://hdl.handle.net/11536/22724 |
ISSN: | 1063-8210 |
DOI: | 10.1109/TVLSI.2012.2220386 |
期刊: | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS |
Volume: | 21 |
Issue: | 10 |
起始页: | 1837 |
结束页: | 1848 |
显示于类别: | Articles |
文件中的档案:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.