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dc.contributor.authorChang, Hua-Yuen_US
dc.contributor.authorHui-Ru, Irisen_US
dc.contributor.authorChang, Yao-Wenen_US
dc.date.accessioned2014-12-08T15:32:54Z-
dc.date.available2014-12-08T15:32:54Z-
dc.date.issued2013-11-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2013.2272540en_US
dc.identifier.urihttp://hdl.handle.net/11536/22949-
dc.description.abstractDue to the rapidly increasing design complexity in modern IC designs, metal-only engineering change order (ECO) becomes inevitable to achieve design closure with a low respin cost. Traditionally, preplaced redundant standard cells are regarded as spare cells. However, these cells are limited by predefined functionalities and locations, and they always consume leakage power despite their inputs being tied off. To overcome the inflexibility and power overhead, a new type of spare cells, called metal-configurable gate-array spare cells, are introduced. In this paper, we address a new ECO problem, which performs design changes using metal-configurable gate-array spare cells. We first study the properties of this new ECO problem and propose a new cost metric, aliveness, to model the capability of a spare gate array. Based on aliveness and routability, we then develop two ECO optimization frameworks, one for timing ECO and the other for functional ECO. Experimental results show that our approach delivers superior efficiency and effectiveness.en_US
dc.language.isoen_USen_US
dc.subjectEngineering change orderen_US
dc.subjectgate arrayen_US
dc.subjectmixed integer linear programmingen_US
dc.titleECO Optimization Using Metal-Configurable Gate-Array Spare Cellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2013.2272540en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume32en_US
dc.citation.issue11en_US
dc.citation.spage1722en_US
dc.citation.epage1733en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000325975600007-
dc.citation.woscount0-
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