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dc.contributor.authorLin, Chern-Shengen_US
dc.contributor.authorLin, Chih-Weien_US
dc.contributor.authorYang, Shih-Weien_US
dc.contributor.authorLin, Shir-Kuanen_US
dc.contributor.authorChiu, Chuang-Chienen_US
dc.date.accessioned2014-12-08T15:33:07Z-
dc.date.available2014-12-08T15:33:07Z-
dc.date.issued2013-08-01en_US
dc.identifier.issn1079-8587en_US
dc.identifier.urihttp://dx.doi.org/10.1080/10798587.2013.778052en_US
dc.identifier.urihttp://hdl.handle.net/11536/23048-
dc.description.abstractThis study proposed an automatic optical inspection (AOI) technique to improve the inspection of chemical stains on solar wafers. Poly-silicon solar cell wafers were inspected for chemical stains, and the inspection was rapid and stable. The system used a laser-reflection-point-based AOI method for solar wafer chemical stain inspection. Based on the fuzzy theory, the image binarization algorithm could efficiently filter irrelevant image information, and the back-propagation method was also utilized to determine if the image was stained. The inspection algorithm integrated fuzzy theory and the back-propagation method in order to shorten the comparison time and quickly find the target. The experiment proved that the validity of the proposed method could achieve a recognition rate of 98% from among 1000 images.en_US
dc.language.isoen_USen_US
dc.subjectSolar waferen_US
dc.subjectLaser-reflection-point based AOI methoden_US
dc.subjectChemical stain inspectionen_US
dc.subjectFuzzy theoryen_US
dc.subjectBack-propagationen_US
dc.subjectImage binarization algorithmen_US
dc.subjectStain recognitionen_US
dc.titleTHE CHEMICAL STAIN INSPECTION OF POLYSILICON SOLAR CELL WAFER BY THE FUZZY THEORY METHODen_US
dc.typeArticleen_US
dc.identifier.doi10.1080/10798587.2013.778052en_US
dc.identifier.journalINTELLIGENT AUTOMATION AND SOFT COMPUTINGen_US
dc.citation.volume19en_US
dc.citation.issue3en_US
dc.citation.spage391en_US
dc.citation.epage406en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000326140200016-
dc.citation.woscount0-
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