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dc.contributor.authorWU, CCen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorCHEN, PAen_US
dc.contributor.authorCHEN, HDen_US
dc.contributor.authorLIN, KCen_US
dc.contributor.authorCHAN, SHen_US
dc.date.accessioned2014-12-08T15:03:47Z-
dc.date.available2014-12-08T15:03:47Z-
dc.date.issued1994-09-05en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.112091en_US
dc.identifier.urihttp://hdl.handle.net/11536/2326-
dc.description.abstractBis(cyclopentadienyl) magnesium, CP2Mg, was used as a magnesium dopant in the InGaAlP layers by low-pressure metalorganic chemical vapor deposition. The hazy surface morphology of heavily doped InGaAlP layers is significantly improved by using magnesium dopant instead of the conventional zinc dopant. We demonstrate that the effective doping efficiency of magnesium is two orders of magnitude higher than that of zinc dopant in the heavily doped InGaAlP layer grown at 720-degrees-C.en_US
dc.language.isoen_USen_US
dc.titleMAGNESIUM DOPING OF INGAALP GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITIONen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.112091en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume65en_US
dc.citation.issue10en_US
dc.citation.spage1269en_US
dc.citation.epage1271en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1994PE88000023-
dc.citation.woscount3-
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