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dc.contributor.authorLuo, Cheng-Gaoen_US
dc.contributor.authorXiao, Xiaoen_US
dc.contributor.authorMartinez-Corral, Manuelen_US
dc.contributor.authorChen, Chih-Weien_US
dc.contributor.authorJavidi, Bahramen_US
dc.contributor.authorWang, Qiong-Huaen_US
dc.date.accessioned2014-12-08T15:34:02Z-
dc.date.available2014-12-08T15:34:02Z-
dc.date.issued2013-12-16en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.21.031263en_US
dc.identifier.urihttp://hdl.handle.net/11536/23410-
dc.description.abstractIn this paper, we analyze the depth of field (DOF) of integral imaging displays based on wave optics. With considering the diffraction effect, we analyze the intensity distribution of light with multiple microlenses and derive a DOF calculation formula for integral imaging display system. We study the variations of DOF values with different system parameters. Experimental results are provided to verify the accuracy of the theoretical analysis. The analyses and experimental results presented in this paper could be beneficial for better understanding and designing of integral imaging displays. (C) 2013 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleAnalysis of the depth of field of integral imaging displays based on wave opticsen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.21.031263en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume21en_US
dc.citation.issue25en_US
dc.citation.spage31263en_US
dc.citation.epage31273en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000328575700109-
dc.citation.woscount3-
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