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Critical point defect detection for small-pixel thin-film transistor array applied to medical display
Critical point defect detection for small-pixel thin-film transistor array applied to medical display
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Date
2013-09-01
Authors
Wang, Yao-Chin
Lin, Bor-Shyh
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DOI
10.1002/jsid.195
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URI
http://dx.doi.org/10.1002/jsid.195
https://ir.lib.nycu.edu.tw/handle/11536/23727
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