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dc.contributor.authorLin, Bing-Chengen_US
dc.contributor.authorChen, Kuo-Juen_US
dc.contributor.authorWang, Chao-Hsunen_US
dc.contributor.authorChiu, Ching-Hsuehen_US
dc.contributor.authorLan, Yu-Pinen_US
dc.contributor.authorLin, Chien-Chungen_US
dc.contributor.authorLee, Po-Tsungen_US
dc.contributor.authorShih, Min-Hsiungen_US
dc.contributor.authorKuo, Yen-Kuangen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.date.accessioned2014-12-08T15:35:07Z-
dc.date.available2014-12-08T15:35:07Z-
dc.date.issued2014-01-13en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.22.000463en_US
dc.identifier.urihttp://hdl.handle.net/11536/23839-
dc.description.abstractA tapered AlGaN electron blocking layer with step-graded aluminum composition is analyzed in nitride-based blue light-emitting diode (LED) numerically and experimentally. The energy band diagrams, electrostatic fields, carrier concentration, electron current density profiles, and hole transmitting probability are investigated. The simulation results demonstrated that such tapered structure can effectively enhance the hole injection efficiency as well as the electron confinement. Consequently, the LED with a tapered EBL grown by metal-organic chemical vapor deposition exhibits reduced efficiency droop behavior of 29% as compared with 44% for original LED, which reflects the improvement in hole injection and electron overflow in our design. (C)2014 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleHole injection and electron overflow improvement in InGaN/GaN light-emitting diodes by a tapered AlGaN electron blocking layeren_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.22.000463en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume22en_US
dc.citation.issue1en_US
dc.citation.spage463en_US
dc.citation.epage469en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000330579300068-
dc.citation.woscount9-
Appears in Collections:Articles


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