完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHEN, WK | en_US |
dc.contributor.author | CHANG, CS | en_US |
dc.contributor.author | CHEN, WC | en_US |
dc.date.accessioned | 2014-12-08T15:03:52Z | - |
dc.date.available | 2014-12-08T15:03:52Z | - |
dc.date.issued | 1994-08-01 | en_US |
dc.identifier.issn | 0021-4922 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/2393 | - |
dc.description.abstract | The low-temperature (LT) epitaxial growth of high quality GaAs films is achieved by using triethylgallium and tertiarybutylarsine as the precursors. Without any external work, the deposition can be conducted at a temperature as low as 350-degrees-C in a conventional metalorganic chemical vapor deposition system. The full width at half-maximum of 77 K photoluminescence and X-ray rocking curve for a sample grown at 425-degrees-C are 8.2 meV and 14 arcsec, respectively. Materials with good electrical properties were also obtained. A Schottky diode formed on the LT CaAs epilayer shows a barrier height of 0.83 eV, and a reverse saturation current of 1.1 X 10(-7) A/cm2, comparable to that of a normal GaAs Schottky diode. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | LOW-TEMPERATURE EPITAXY | en_US |
dc.subject | GAAS | en_US |
dc.subject | MOCVD | en_US |
dc.title | LOW-TEMPERATURE EPITAXY OF GAAS BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | en_US |
dc.citation.volume | 33 | en_US |
dc.citation.issue | 8A | en_US |
dc.citation.spage | L1052 | en_US |
dc.citation.epage | L1055 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:A1994PC13300002 | - |
dc.citation.woscount | 1 | - |
顯示於類別: | 期刊論文 |