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dc.contributor.authorZheng, Z. W.en_US
dc.contributor.authorChen, Y. C.en_US
dc.date.accessioned2014-12-08T15:35:28Z-
dc.date.available2014-12-08T15:35:28Z-
dc.date.issued2014-03-01en_US
dc.identifier.issn1738-8090en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s13391-013-3154-7en_US
dc.identifier.urihttp://hdl.handle.net/11536/24006-
dc.description.abstractIn this study, static induction transistor (SIT) using TaN thin film as gate electrode was fabricated and the characteristics of this device were investigated. The electrical characteristics showed that the drain-source current was controlled by the bias voltage that applied to the TaN gate electrode. The typical SIT operations with non-saturation property and a transition from linear to nonlinear behavior were observed in the drain-source I-V characteristics. Furthermore, compared with the traditional devices, this SIT device can obtain a high working current (similar to 5 mA) at a low driving voltage (similar to 3 V) with a small threshold voltage (similar to 1 V), showing its high potential for high current and low voltage application.en_US
dc.language.isoen_USen_US
dc.subjectstatic induction transistor (SIT)en_US
dc.subjectsemiconductorsen_US
dc.subjectthin filmsen_US
dc.subjectelectrical propertiesen_US
dc.titleStatic Induction Transistor Using TaN Thin Film as Gate Electrode for High-Performance Applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s13391-013-3154-7en_US
dc.identifier.journalELECTRONIC MATERIALS LETTERSen_US
dc.citation.volume10en_US
dc.citation.issue2en_US
dc.citation.spage383en_US
dc.citation.epage385en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.identifier.wosnumberWOS:000333004300011-
dc.citation.woscount0-
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