完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Zheng, Z. W. | en_US |
dc.contributor.author | Chen, Y. C. | en_US |
dc.date.accessioned | 2014-12-08T15:35:28Z | - |
dc.date.available | 2014-12-08T15:35:28Z | - |
dc.date.issued | 2014-03-01 | en_US |
dc.identifier.issn | 1738-8090 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s13391-013-3154-7 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/24006 | - |
dc.description.abstract | In this study, static induction transistor (SIT) using TaN thin film as gate electrode was fabricated and the characteristics of this device were investigated. The electrical characteristics showed that the drain-source current was controlled by the bias voltage that applied to the TaN gate electrode. The typical SIT operations with non-saturation property and a transition from linear to nonlinear behavior were observed in the drain-source I-V characteristics. Furthermore, compared with the traditional devices, this SIT device can obtain a high working current (similar to 5 mA) at a low driving voltage (similar to 3 V) with a small threshold voltage (similar to 1 V), showing its high potential for high current and low voltage application. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | static induction transistor (SIT) | en_US |
dc.subject | semiconductors | en_US |
dc.subject | thin films | en_US |
dc.subject | electrical properties | en_US |
dc.title | Static Induction Transistor Using TaN Thin Film as Gate Electrode for High-Performance Application | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s13391-013-3154-7 | en_US |
dc.identifier.journal | ELECTRONIC MATERIALS LETTERS | en_US |
dc.citation.volume | 10 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 383 | en_US |
dc.citation.epage | 385 | en_US |
dc.contributor.department | 光電系統研究所 | zh_TW |
dc.contributor.department | Institute of Photonic System | en_US |
dc.identifier.wosnumber | WOS:000333004300011 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |