標題: | Low-temperature direct copper-to-copper bonding enabled by creep on highly (111)-oriented Cu surfaces |
作者: | Liu, Chien-Min Lin, Han-Wen Chu, Yi-Cheng Chen, Chih Lyu, Dian-Rong Chen, Kuan-Neng Tu, K. N. 材料科學與工程學系 電子工程學系及電子研究所 Department of Materials Science and Engineering Department of Electronics Engineering and Institute of Electronics |
關鍵字: | Cu-to-Cu direct bonding;Creep;Diffusion;Preferred orientation |
公開日期: | 1-五月-2014 |
摘要: | We achieve low-temperature Cu-to-Cu direct bonding using highly (1 1 1)-orientated Cu films. The bonding temperature can be lowered to 200 degrees C at a stress of 114 psi for 30 min at 10(-3) torr. The temperature is lower than the reflow temperature of 250 degrees C for Pb-free solders. Our breakthrough is based on the finding that the Cu (1 1 1) surface diffusivity is the fastest among all the planes of Cu and the bonding process can occur through surface diffusion creep on the (1 1 1) surfaces. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.scriptamat.2014.01.040 http://hdl.handle.net/11536/24211 |
ISSN: | 1359-6462 |
DOI: | 10.1016/j.scriptamat.2014.01.040 |
期刊: | SCRIPTA MATERIALIA |
Volume: | 78-79 |
Issue: | |
起始頁: | 65 |
結束頁: | 68 |
顯示於類別: | 期刊論文 |