Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chuang, Che-Hao | en_US |
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.date.accessioned | 2014-12-08T15:36:01Z | - |
dc.date.available | 2014-12-08T15:36:01Z | - |
dc.date.issued | 2014-10-01 | en_US |
dc.identifier.issn | 0278-0046 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TIE.2013.2297292 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/24378 | - |
dc.description.abstract | A novel on-chip transient voltage suppressor (TVS) integrated with the silicon-based transceiver IC has been proposed and verified in a 0.8 mu m bipolar CMOS DMOS (BCD) process for IEC 61000-4-2 system-level electrostatic discharge (ESD) protection. The structure of on-chip TVS is a high-voltage dual silicon-controlled rectifier (DSCR) with +/- 16 V of high holding voltage (Vh) under the evaluation of the transmission line pulsing (TLP) system with the pulse width of 100 ns. With the high holding current (Ih) of on-chip TVS, this design can pass +/- 200 mA latch-up testing. Therefore, the on-chip TVS can be safely applied to protect the RS232 transceiver with the signal level of +/- 15 V. The RS232 transceiver IC with on-chip TVS has been evaluated to pass the IEC61000-4-2 contact +/- 12 kV stress without any hardware damages and latch-up issue. Moreover, the proposed RS232 transceiver IC has been verified to well protect the system over the IEC 61000-4-2 contact +/- 20 kV stress (class B) in the notebook applications. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Electrostatic discharge (ESD) | en_US |
dc.subject | RS232 | en_US |
dc.subject | silicon-controlled rectifier (SCR) | en_US |
dc.subject | transient voltage suppressor (TVS) | en_US |
dc.title | On-Chip Transient Voltage Suppressor Integrated With Silicon-Based Transceiver IC for System-Level ESD Protection | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TIE.2013.2297292 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | en_US |
dc.citation.volume | 61 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 5615 | en_US |
dc.citation.epage | 5621 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000336208200049 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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