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dc.contributor.authorChuang, Che-Haoen_US
dc.contributor.authorKer, Ming-Douen_US
dc.date.accessioned2014-12-08T15:36:01Z-
dc.date.available2014-12-08T15:36:01Z-
dc.date.issued2014-10-01en_US
dc.identifier.issn0278-0046en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TIE.2013.2297292en_US
dc.identifier.urihttp://hdl.handle.net/11536/24378-
dc.description.abstractA novel on-chip transient voltage suppressor (TVS) integrated with the silicon-based transceiver IC has been proposed and verified in a 0.8 mu m bipolar CMOS DMOS (BCD) process for IEC 61000-4-2 system-level electrostatic discharge (ESD) protection. The structure of on-chip TVS is a high-voltage dual silicon-controlled rectifier (DSCR) with +/- 16 V of high holding voltage (Vh) under the evaluation of the transmission line pulsing (TLP) system with the pulse width of 100 ns. With the high holding current (Ih) of on-chip TVS, this design can pass +/- 200 mA latch-up testing. Therefore, the on-chip TVS can be safely applied to protect the RS232 transceiver with the signal level of +/- 15 V. The RS232 transceiver IC with on-chip TVS has been evaluated to pass the IEC61000-4-2 contact +/- 12 kV stress without any hardware damages and latch-up issue. Moreover, the proposed RS232 transceiver IC has been verified to well protect the system over the IEC 61000-4-2 contact +/- 20 kV stress (class B) in the notebook applications.en_US
dc.language.isoen_USen_US
dc.subjectElectrostatic discharge (ESD)en_US
dc.subjectRS232en_US
dc.subjectsilicon-controlled rectifier (SCR)en_US
dc.subjecttransient voltage suppressor (TVS)en_US
dc.titleOn-Chip Transient Voltage Suppressor Integrated With Silicon-Based Transceiver IC for System-Level ESD Protectionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIE.2013.2297292en_US
dc.identifier.journalIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICSen_US
dc.citation.volume61en_US
dc.citation.issue10en_US
dc.citation.spage5615en_US
dc.citation.epage5621en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000336208200049-
dc.citation.woscount0-
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