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dc.contributor.authorLin, Meng-Yuen_US
dc.contributor.authorChen, Yen-Haoen_US
dc.contributor.authorWang, Cheng-Hungen_US
dc.contributor.authorSu, Chen-Fungen_US
dc.contributor.authorChang, Shu-Weien_US
dc.contributor.authorLee, Si-Chenen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.date.accessioned2014-12-08T15:36:05Z-
dc.date.available2014-12-08T15:36:05Z-
dc.date.issued2014-05-05en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4875583en_US
dc.identifier.urihttp://hdl.handle.net/11536/24431-
dc.description.abstractTuning of the Fermi level is investigated in graphene channels using two in-plane gates with significantly different-sized isolating gaps. While the n-type tuning was achievable in both schemes, the wide-gap device had an enhanced minimum drain current and less prominent current modulation than the narrow-gap device. In addition, further p-type tuning was not observed in the wide-gap device at negative gate biases. These phenomena indicated that both devices had distinct field-strength dependences and Fermi level tuning effects, which may be critical for the practical design of devices. (C) 2014 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleField effect of in-plane gates with different gap sizes on the Fermi level tuning of graphene channelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4875583en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume104en_US
dc.citation.issue18en_US
dc.citation.epageen_US
dc.contributor.department光電學院zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentCollege of Photonicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000336249600067-
dc.citation.woscount0-
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