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dc.contributor.authorTUNG, CJen_US
dc.contributor.authorCHEN, YFen_US
dc.contributor.authorKWEI, CMen_US
dc.contributor.authorCHOU, TLen_US
dc.date.accessioned2019-04-03T06:39:10Z-
dc.date.available2019-04-03T06:39:10Z-
dc.date.issued1994-06-15en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.49.16684en_US
dc.identifier.urihttp://hdl.handle.net/11536/2450-
dc.description.abstractElectron differential inverse mean free paths for volume-plasmon excitations and differential probabilities for surface-plasmon excitations have been calculated using dielectric response theory. A model dielectric function which satisfied sum rules and agreed with optical data was established for these calculations. In surface-plasmon calculations, we considered electron-impact emissions of the reflected electron-energy-loss spectroscopy. Formulations were made for obliquely incident electrons with the recoil effect and without the small-scattering-angle assumption. For volume-plasmon excitations, we evaluated corrections due to the exchange and Z1(3) effects. Comparison between calculated results and experimental data extracted from reflected electron-energy-loss spectra showed good agreement. Calculated differential cross sections have been used to solve the transport equation for the angular and energy flux spectra of reflected electrons. Contributions to the spectra from single and plural plasmon excitations were analyzed. It was found that calculated spectra were in good agreement with measured data.en_US
dc.language.isoen_USen_US
dc.titleDIFFERENTIAL CROSS-SECTIONS FOR PLASMON EXCITATIONS AND REFLECTED ELECTRON-ENERGY-LOSS SPECTRAen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.49.16684en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume49en_US
dc.citation.issue23en_US
dc.citation.spage16684en_US
dc.citation.epage16693en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:A1994NT52500073en_US
dc.citation.woscount148en_US
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