Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, Yu-Ming | en_US |
dc.contributor.author | Jiang, Iris Hui-Ru | en_US |
dc.contributor.author | Ho, Sung-Ting | en_US |
dc.date.accessioned | 2014-12-08T15:36:24Z | - |
dc.date.available | 2014-12-08T15:36:24Z | - |
dc.date.issued | 2014-04-01 | en_US |
dc.identifier.issn | 0278-0070 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TCAD.2014.2304681 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/24744 | - |
dc.description.abstract | Modern IC designs are exposed to a wide range of dynamic variations. Traditionally, a conservative timing guardband is required to guarantee correct operations under the worst-case variation, thus leading to performance degradation. To remove the guardband, resilient circuits are proposed. However, the short-path padding (hold time fixing) problem in resilient circuits is far severer than conventional IC design. Therefore, in this paper, we focus on the short-path padding problem to enable the timing error detection and correction mechanism of resilient circuits. Unlike recent prior work adopts greedy heuristics with a local view, we determine the padding values and locations with a global view. Moreover, we utilize spare cells and a dummy metal to further achieve the derived padding values at physical implementation. Experimental results show that our method is promising to validate timing error-resilient circuits. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Delay padding | en_US |
dc.subject | engineering change order | en_US |
dc.subject | hold time fixing | en_US |
dc.subject | linear programming | en_US |
dc.subject | resilient circuits | en_US |
dc.subject | timing analysis | en_US |
dc.title | PushPull: Short-Path Padding for Timing Error Resilient Circuits | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TCAD.2014.2304681 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | en_US |
dc.citation.volume | 33 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 558 | en_US |
dc.citation.epage | 570 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000338135300007 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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