標題: Evaluation and Decision Making in Taiwan Semiconductor Industry through Silicon via Technology
作者: Lin, Grace T. R.
Lee, Yen-Chun
科技管理研究所
Institute of Management of Technology
關鍵字: Technology evaluation and selection;Semiconductor industry;TSV;FDM;FAHP;SAW
公開日期: 1-七月-2014
摘要: In the past decade, Taiwan has emerged as the stronghold of worldwide semiconductor manufacturing. Semiconductor technology companies in Taiwan have been investing numerous resources in emerging through-silicon via (TSV) technology research and development (R&D) to keep enhancing their competitive advantages. The aim of this study was to propose a hybrid approach along with the Moore\'s Law migration pattern to more objectively and effectively select such emerging chip interconnect technologies that can further help to strengthen Taiwan\'s semiconductor industry prospects. The fuzzy Delphi method (FDM) and the fuzzy analytic hierarchy process (FAHP) were integrated to construct a decision-making model for evaluating potential TSV technologies. The simple additive weighting (SAW) method was then used to rank and select TSV technology alternatives. The results of the synthetic evaluation indicated that 3D integrated circuit (IC) TSV was of primary interest for Taiwan\'s semiconductor industry in the aspect of TSV technology development, followed by 2.5D TSV interposer (TSI) and 3D silicon (Si) TSV. Furthermore, "technological merits" was shown as the most critical evaluation dimension, and "heterogeneous integration" represented the most important evaluation criterion. The proposed hybrid model may help senior managers of the semiconductor industry or government policy makers to direct R&D and allocate-relevant resources more strategically.
URI: http://hdl.handle.net/11536/24915
ISSN: 0022-4456
期刊: JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH
Volume: 73
Issue: 7
起始頁: 456
結束頁: 460
顯示於類別:期刊論文