| 標題: | Motional Resistance Issue of TSV-Based Resonator Device and Its Improvement With a Concave Cu TSV Structural Design |
| 作者: | Shih, Jian-Yu Chen, Yen-Chi Chiu, Chih-Hung Chen, Kuan-Neng 交大名義發表 電子工程學系及電子研究所 National Chiao Tung University Department of Electronics Engineering and Institute of Electronics |
| 關鍵字: | Three-dimensional (3D) integration;concave through silicon via (TSV);motional resistance |
| 公開日期: | 1-八月-2014 |
| 摘要: | Motional resistance of TSV-based resonator devices with 3D integration techniques is investigated at the operating oscillating mode. Even with well-developed TSV and device fabrication, the motional resistance issue of the TSV-based resonator device is found due to the poor connected Ag paste. The corresponding solution is demonstrated by a modified concave Cu TSVs structure. This modified concave Cu TSV design shows the excellent device characteristics and no visible gaps between the Cu TSVs and resonator devices to insure a good electrical connection. |
| URI: | http://dx.doi.org/10.1109/LED.2014.2327117 http://hdl.handle.net/11536/25228 |
| ISSN: | 0741-3106 |
| DOI: | 10.1109/LED.2014.2327117 |
| 期刊: | IEEE ELECTRON DEVICE LETTERS |
| Volume: | 35 |
| Issue: | 8 |
| 起始頁: | 865 |
| 結束頁: | 867 |
| 顯示於類別: | 期刊論文 |

