標題: Motional Resistance Issue of TSV-Based Resonator Device and Its Improvement With a Concave Cu TSV Structural Design
作者: Shih, Jian-Yu
Chen, Yen-Chi
Chiu, Chih-Hung
Chen, Kuan-Neng
交大名義發表
電子工程學系及電子研究所
National Chiao Tung University
Department of Electronics Engineering and Institute of Electronics
關鍵字: Three-dimensional (3D) integration;concave through silicon via (TSV);motional resistance
公開日期: 1-Aug-2014
摘要: Motional resistance of TSV-based resonator devices with 3D integration techniques is investigated at the operating oscillating mode. Even with well-developed TSV and device fabrication, the motional resistance issue of the TSV-based resonator device is found due to the poor connected Ag paste. The corresponding solution is demonstrated by a modified concave Cu TSVs structure. This modified concave Cu TSV design shows the excellent device characteristics and no visible gaps between the Cu TSVs and resonator devices to insure a good electrical connection.
URI: http://dx.doi.org/10.1109/LED.2014.2327117
http://hdl.handle.net/11536/25228
ISSN: 0741-3106
DOI: 10.1109/LED.2014.2327117
期刊: IEEE ELECTRON DEVICE LETTERS
Volume: 35
Issue: 8
起始頁: 865
結束頁: 867
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