Full metadata record
DC FieldValueLanguage
dc.contributor.authorLiu, Yu-Sianen_US
dc.contributor.authorHuang, Chien-Joen_US
dc.contributor.authorKuo, Fu-Yenen_US
dc.contributor.authorWen, Kuei-Annen_US
dc.contributor.authorFan, Long-Shengen_US
dc.date.accessioned2014-12-08T15:36:54Z-
dc.date.available2014-12-08T15:36:54Z-
dc.date.issued2013-01-01en_US
dc.identifier.isbn978-1-4673-2232-4; 978-1-4673-2230-0en_US
dc.identifier.issnen_US
dc.identifier.urihttp://hdl.handle.net/11536/25291-
dc.description.abstractA monolithic accelerometer design with zero-g calibration with TSMC 0.18 mu m mixed-signal 1P6M process is presented. On-chip digital offset calibration enables compensation of random mechanical offset in the sensor due to process variation. The maximum 21 fF capacitance mismatch can be calibrated. The simulation results show that the whole system have 452.1 mV/g sensitivity. The power consumption is about 1.16 mW. The output noise is 26.85 mu g/v Hz at 1KHz.en_US
dc.language.isoen_USen_US
dc.titleA Monolithic CMOS/MEMS Accelerometer with Zero-g Calibration Readout Circuiten_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 IEEE EUROCONen_US
dc.citation.volumeen_US
dc.citation.issueen_US
dc.citation.spage2106en_US
dc.citation.epage2110en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000343135600314-
Appears in Collections:Conferences Paper