The potential of functional scaling

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DC Field	Value	Language
dc.contributor.author	Chin, A	en_US
dc.contributor.author	McAlister, SP	en_US
dc.date.accessioned	2014-12-08T15:36:58Z	-
dc.date.available	2014-12-08T15:36:58Z	-
dc.date.issued	2005-01-01	en_US
dc.identifier.issn	8755-3996	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/MCD.2005.1388766	en_US
dc.identifier.uri	http://hdl.handle.net/11536/25366	-
dc.language.iso	en_US	en_US
dc.title	The potential of functional scaling	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/MCD.2005.1388766	en_US
dc.identifier.journal	IEEE CIRCUITS & DEVICES	en_US
dc.citation.volume	21	en_US
dc.citation.issue	1	en_US
dc.citation.spage	27	en_US
dc.citation.epage	35	en_US
dc.contributor.department	奈米科技中心	zh_TW
dc.contributor.department	Center for Nanoscience and Technology	en_US
dc.identifier.wosnumber	WOS:000227072100004	-
dc.citation.woscount	9	-
Appears in Collections:	Articles

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