標題: | RHEED in-situ monitored step edge diffusion during interrupted laser ablation epitaxy growth of SrTiO3 |
作者: | Wang, TC Lee, JY Hsieh, CC Juang, JY Wu, KH Uen, TM Gou, YS 電子物理學系 Department of Electrophysics |
公開日期: | 1-Dec-2004 |
摘要: | A series of investigations on the interrupted deposition of laser ablation strontium titanate epitaxy growth were conducted. RHEED intensity recovery curves at various temperatures show a near-quadratic power law dependence on annealing time. Combined with the evidence showing the intimate correlation between the step edge density and the RHEED intensity, a diffusion Arrhenius plot with the activation energy of 1.0 eV was obtained for the kinetics of step edge migration. |
URI: | http://hdl.handle.net/11536/25585 |
ISSN: | 0577-9073 |
期刊: | CHINESE JOURNAL OF PHYSICS |
Volume: | 42 |
Issue: | 6 |
起始頁: | 710 |
結束頁: | 716 |
Appears in Collections: | Articles |
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