RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films
Loading...
Date
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
10.1016/S0921-4526(99)02981-6
Abstract
The amplitude and periodicity of the reflection high-energy electron diffraction (RHEED) oscillations displayed strong temperature dependence in homoepitaxy of SrTiO3(STO) films. Combining with the AFM observations, the results suggest that the oscillations are not directly related to the layer-by-layer growth. (C) 2000 Elsevier Science B.V. All rights reserved.