Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wang, YW | en_US |
dc.contributor.author | Cheng, HL | en_US |
dc.contributor.author | Wang, YK | en_US |
dc.contributor.author | Hu, TH | en_US |
dc.contributor.author | Ho, JC | en_US |
dc.contributor.author | Lee, CC | en_US |
dc.contributor.author | Lei, TF | en_US |
dc.contributor.author | Yeh, CF | en_US |
dc.date.accessioned | 2014-12-08T15:37:17Z | - |
dc.date.available | 2014-12-08T15:37:17Z | - |
dc.date.issued | 2004-11-22 | en_US |
dc.identifier.issn | 0040-6090 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/j.tsf.2004.04.001 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/25628 | - |
dc.description.abstract | This work concerns the electrical properties and carrier transport behavior of polycrystalline pentacene-based thin film transistors (TFTs) in air and high-vacuum environments. The transistor in a high vacuum outperforms that in air. The dependence of the field-effect mobility on the gate voltage and the drain voltage is considered. A potential barrier model is applied to estimate the trap density of the pentacene transistor. The determined trap density at the grain boundaries of the pentacene film in air exceeds that in a high vacuum. These results show that the increased trap concentration at the grain boundaries in ambient air limits carrier transport. (C) 2004 Elsevier B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | organic semiconductors | en_US |
dc.subject | electronic devices | en_US |
dc.subject | electrical properties and measurements | en_US |
dc.title | Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/j.tsf.2004.04.001 | en_US |
dc.identifier.journal | THIN SOLID FILMS | en_US |
dc.citation.volume | 467 | en_US |
dc.citation.issue | 1-2 | en_US |
dc.citation.spage | 215 | en_US |
dc.citation.epage | 219 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000224185100036 | - |
dc.citation.woscount | 35 | - |
Appears in Collections: | Articles |
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