標題: | Critical length of nanowires for hydrophobic behavior |
作者: | Cheng, YH Chou, CK Chih, C Cheng, SY 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 11-十月-2004 |
摘要: | This Letter investigates the wetting behavior on surface with well-controlled nanoscale structure. Water and water-alcohol droplets were brought to contact the surface electroplated by Ag nanowires. It is found that hydrophobic behavior becomes more pronounced as the length of the nanowires increases. A critical length of approximately 100 nm is observed, beyond which the contact angle approaches a steady value of 130degrees. In addition, the contact angle of water levels off around 160degrees when the length of the fluorine-coated Ag nanowires exceeds the critical value of 100 nm. The mechanism of the hydrophobic behavior on surface with nanoscale structure is proposed. (C) 2004 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.cplett.2004.08.063 http://hdl.handle.net/11536/25766 |
ISSN: | 0009-2614 |
DOI: | 10.1016/j.cplett.2004.08.063 |
期刊: | CHEMICAL PHYSICS LETTERS |
Volume: | 397 |
Issue: | 1-3 |
起始頁: | 17 |
結束頁: | 20 |
顯示於類別: | 期刊論文 |