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dc.contributor.authorChen, Yi-Hsinen_US
dc.contributor.authorWen, Yu-Chiehen_US
dc.contributor.authorLiu, Wei-Reinen_US
dc.contributor.authorHsieh, Wen-Fengen_US
dc.contributor.authorSun, Chi-Kuangen_US
dc.date.accessioned2014-12-08T15:37:30Z-
dc.date.available2014-12-08T15:37:30Z-
dc.date.issued2011-02-01en_US
dc.identifier.issn0577-9073en_US
dc.identifier.urihttp://hdl.handle.net/11536/25813-
dc.description.abstractThe longitudinal acoustic velocity in the direction normal to the c-axis and the birefringence of refractive index of a-plane zinc oxide (ZnO) thin films were measured by ultrafast transient reflection measurement. Through Fourier analysis, the experimental data show that the acoustic velocity is about 6000 m/s and the measured refractive index near the band gap, which is higher than the previously reported results by 20 similar to 30%.en_US
dc.language.isoen_USen_US
dc.titleAcoustic Velocity and Optical Index Birefringence in A-Plane ZnO Thin Filmsen_US
dc.typeArticleen_US
dc.identifier.journalCHINESE JOURNAL OF PHYSICSen_US
dc.citation.volume49en_US
dc.citation.issue1en_US
dc.citation.spage201en_US
dc.citation.epage208en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000286490100026-
dc.citation.woscount3-
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