標題: | Large field-induced strains in a lead-free piezoelectric material |
作者: | Zhang, J. X. Xiang, B. He, Q. Seidel, J. Zeches, R. J. Yu, P. Yang, S. Y. Wang, C. H. Chu, Y-H Martin, L. W. Minor, A. M. Ramesh, R. 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 1-Feb-2011 |
摘要: | Piezoelectric materials exhibit a mechanical response to electrical inputs, as well as an electrical response to mechanical inputs, which makes them useful in sensors and actuators(1). Lead-based piezoelectrics demonstrate a large mechanical response, but they also pose a health risk(2). The ferroelectric BiFeO(3) is an attractive alternative because it is lead-free, and because strain can stabilize BiFeO(3) phases with a structure that resembles a morphotropic phase boundary(3). Here we report a reversible electric-field-induced strain of over 5% in BiFeO(3) films, together with a characterization of the origins of this effect. In situ transmission electron microscopy coupled with nanoscale electrical and mechanical probing shows that large strains result from moving the boundaries between tetragonal- and rhombohedral-like phases, which changes the phase stability of the mixture. These results demonstrate the potential of BiFeO(3) as a substitute for lead-based materials in future piezoelectric applications. |
URI: | http://dx.doi.org/10.1038/nnano.2010.265 http://hdl.handle.net/11536/25850 |
ISSN: | 1748-3387 |
DOI: | 10.1038/nnano.2010.265 |
期刊: | NATURE NANOTECHNOLOGY |
Volume: | 6 |
Issue: | 2 |
起始頁: | 97 |
結束頁: | 101 |
Appears in Collections: | Articles |
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