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dc.contributor.authorKuo, Cheng-Huangen_US
dc.contributor.authorChang, Li-Chuanen_US
dc.contributor.authorChou, Hsiu-Meien_US
dc.date.accessioned2014-12-08T15:37:44Z-
dc.date.available2014-12-08T15:37:44Z-
dc.date.issued2011en_US
dc.identifier.issn0013-4651en_US
dc.identifier.urihttp://hdl.handle.net/11536/25933-
dc.identifier.urihttp://dx.doi.org/10.1149/1.3617533en_US
dc.description.abstractIn this study, heavily Si-doped n-type GaN (n-GaN) epitaxial layers with and without nanorod GaN (NR GaN) template were grown by metal organic chemical vapor deposition (MOCVD) system. It was found that we could achieve high-qulaity heavily Si-doped n-GaN layers by using the NR GaN template. It was also found that we can reduce etching pits density in n-GaN (1.5E19 cm(-3)) epitaxial layer by a factor of 2.82 using the NR GaN template, as compared to the conventional sapphire substrate. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3617533] All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectdoping profilesen_US
dc.subjectelemental semiconductorsen_US
dc.subjectetchingen_US
dc.subjectgallium compoundsen_US
dc.subjectheavily doped semiconductorsen_US
dc.subjectIII-V semiconductorsen_US
dc.subjectMOCVDen_US
dc.subjectnanofabricationen_US
dc.subjectnanorodsen_US
dc.subjectsemiconductor dopingen_US
dc.subjectsemiconductor epitaxial layersen_US
dc.subjectsemiconductor growthen_US
dc.subjectsiliconen_US
dc.subjectwide band gap semiconductorsen_US
dc.titleRegrowth of High Quality Heavily Si-Doped nGaN Utilizing Nano-Rod GaN Templateen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.3617533en_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.citation.volume158en_US
dc.citation.issue10en_US
dc.citation.spageH961en_US
dc.citation.epageH964en_US
dc.contributor.department照明與能源光電研究所zh_TW
dc.contributor.departmentInstitute of Lighting and Energy Photonicsen_US
dc.identifier.wosnumberWOS:000294063000066-
dc.citation.woscount2-
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