標題: | Regrowth of High Quality Heavily Si-Doped nGaN Utilizing Nano-Rod GaN Template |
作者: | Kuo, Cheng-Huang Chang, Li-Chuan Chou, Hsiu-Mei 照明與能源光電研究所 Institute of Lighting and Energy Photonics |
關鍵字: | doping profiles;elemental semiconductors;etching;gallium compounds;heavily doped semiconductors;III-V semiconductors;MOCVD;nanofabrication;nanorods;semiconductor doping;semiconductor epitaxial layers;semiconductor growth;silicon;wide band gap semiconductors |
公開日期: | 2011 |
摘要: | In this study, heavily Si-doped n-type GaN (n-GaN) epitaxial layers with and without nanorod GaN (NR GaN) template were grown by metal organic chemical vapor deposition (MOCVD) system. It was found that we could achieve high-qulaity heavily Si-doped n-GaN layers by using the NR GaN template. It was also found that we can reduce etching pits density in n-GaN (1.5E19 cm(-3)) epitaxial layer by a factor of 2.82 using the NR GaN template, as compared to the conventional sapphire substrate. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3617533] All rights reserved. |
URI: | http://hdl.handle.net/11536/25933 http://dx.doi.org/10.1149/1.3617533 |
ISSN: | 0013-4651 |
DOI: | 10.1149/1.3617533 |
期刊: | JOURNAL OF THE ELECTROCHEMICAL SOCIETY |
Volume: | 158 |
Issue: | 10 |
起始頁: | H961 |
結束頁: | H964 |
Appears in Collections: | Articles |
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