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dc.contributor.authorCHEN, MJen_US
dc.contributor.authorGU, YBen_US
dc.contributor.authorWU, Ten_US
dc.contributor.authorHSU, PCen_US
dc.contributor.authorLIU, THen_US
dc.date.accessioned2014-12-08T15:04:07Z-
dc.date.available2014-12-08T15:04:07Z-
dc.date.issued1994-02-03en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://dx.doi.org/10.1049/el:19940177en_US
dc.identifier.urihttp://hdl.handle.net/11536/2618-
dc.description.abstractBased on experimental analogue MOS switches, the Letter reports a new observation of the charge injection component due to channel charges in weak inversion. As identified by the mixed-mode circuit and device simulations, this new component can contribute comparably to the switch-induced error voltage on a switched capacitor.en_US
dc.language.isoen_USen_US
dc.subjectINTEGRATED CIRCUITSen_US
dc.subjectSWITCHED CAPACITOR NETWORKSen_US
dc.titleNEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHESen_US
dc.typeArticleen_US
dc.identifier.doi10.1049/el:19940177en_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.citation.volume30en_US
dc.citation.issue3en_US
dc.citation.spage213en_US
dc.citation.epage214en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1994MX97100030-
dc.citation.woscount2-
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