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dc.contributor.authorChen, Chun-Shuen_US
dc.contributor.authorHuang, Hsin-Chengen_US
dc.date.accessioned2014-12-08T15:38:10Z-
dc.date.available2014-12-08T15:38:10Z-
dc.date.issued2011-01-01en_US
dc.identifier.issn0378-3758en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jspi.2010.06.017en_US
dc.identifier.urihttp://hdl.handle.net/11536/26190-
dc.description.abstractSpline smoothing is a popular technique for curve fitting, in which selection of the smoothing parameter is crucial. Many methods such as Mallows' C(p), generalized maximum likelihood (GML), and the extended exponential (EE) criterion have been proposed to select this parameter. Although C(p) is shown to be asymptotically optimal, it is usually outperformed by other selection criteria for small to moderate sample sizes due to its high variability. On the other hand, GML and EE are more stable than C(p), but they do not possess the same asymptotic optimality as C(p). Instead of selecting this smoothing parameter directly using C(p), we propose to select among a small class of selection criteria based on Stein's unbiased risk estimate (SURE). Due to the selection effect, the spline estimate obtained from a criterion in this class is nonlinear. Thus, the effective degrees of freedom in SURE contains an adjustment term in addition to the trace of the smoothing matrix, which cannot be ignored in small to moderate sample sizes. The resulting criterion, which we call adaptive C(p), is shown to have an analytic expression, and hence can be efficiently computed. Moreover, adaptive C(p) is not only demonstrated to be superior and more stable than commonly used selection criteria in a simulation study, but also shown to possess the same asymptotic optimality as C(p). (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleAn improved C(p) criterion for spline smoothingen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jspi.2010.06.017en_US
dc.identifier.journalJOURNAL OF STATISTICAL PLANNING AND INFERENCEen_US
dc.citation.volume141en_US
dc.citation.issue1en_US
dc.citation.spage445en_US
dc.citation.epage452en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
Appears in Collections:Articles