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dc.contributor.authorChen, Yen-Liangen_US
dc.contributor.authorHsieh, Hung-Chihen_US
dc.contributor.authorWu, Wang-Tsungen_US
dc.contributor.authorChang, Wei-Yaoen_US
dc.contributor.authorSu, Der-Chinen_US
dc.date.accessioned2014-12-08T15:38:15Z-
dc.date.available2014-12-08T15:38:15Z-
dc.date.issued2010-12-20en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://dx.doi.org/10.1364/AO.49.006888en_US
dc.identifier.urihttp://hdl.handle.net/11536/26211-
dc.description.abstractA linearly/circularly polarized heterodyne light beam coming from a heterodyne light source with an electro-optic modulator in turn enters a modified Twyman-Green interferometer to measure the surface plane of a GRIN lens. Two groups of periodic sinusoidal segments recorded by a fast complementary metal-oxide semiconductor camera are modified, and their associated phases are derived with the unique technique. The data are substituted into the special equations derived from the Fresnel equations, and the refractive index can be obtained. When the processes are applied to other pixels, the full-field refractive-index distribution can be obtained similarly. Its validity is demonstrated. (C) 2010 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleAlternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/AO.49.006888en_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume49en_US
dc.citation.issue36en_US
dc.citation.spage6888en_US
dc.citation.epage6892en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000285499500011-
dc.citation.woscount2-
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