標題: | An alternative bend-testing technique for a flexible indium tin oxide film |
作者: | Chen, Yen-Liang Hsieh, Hung-Chih Wu, Wang-Tsung Wen, Bor-Jiunn Chang, Wei-Yao Su, Der-Chin 光電工程學系 Department of Photonics |
關鍵字: | Indium tin oxide film;Bending test;Refractive index;Electro-optic modulation;Heterodyne interferometry |
公開日期: | 1-Dec-2010 |
摘要: | The two-dimensional refractive index distribution of a flexible indium tin oxide film deposited on a PET layer is measured before/after the bend-testing with an alternative technique based on Fresnel equations and the heterodyne interferometry. Their standard deviations are derived and they vary more obviously than the resistance variations measured in the conventional method. Hence the standard deviation of the refractive index can be used as the indicator to justify the durability of a flexible indium tin oxide film. The validity is demonstrated. (C) 2010 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.displa.2010.07.003 http://hdl.handle.net/11536/26282 |
ISSN: | 0141-9382 |
DOI: | 10.1016/j.displa.2010.07.003 |
期刊: | DISPLAYS |
Volume: | 31 |
Issue: | 4-5 |
起始頁: | 191 |
結束頁: | 195 |
Appears in Collections: | Articles |
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