標題: An alternative bend-testing technique for a flexible indium tin oxide film
作者: Chen, Yen-Liang
Hsieh, Hung-Chih
Wu, Wang-Tsung
Wen, Bor-Jiunn
Chang, Wei-Yao
Su, Der-Chin
光電工程學系
Department of Photonics
關鍵字: Indium tin oxide film;Bending test;Refractive index;Electro-optic modulation;Heterodyne interferometry
公開日期: 1-Dec-2010
摘要: The two-dimensional refractive index distribution of a flexible indium tin oxide film deposited on a PET layer is measured before/after the bend-testing with an alternative technique based on Fresnel equations and the heterodyne interferometry. Their standard deviations are derived and they vary more obviously than the resistance variations measured in the conventional method. Hence the standard deviation of the refractive index can be used as the indicator to justify the durability of a flexible indium tin oxide film. The validity is demonstrated. (C) 2010 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.displa.2010.07.003
http://hdl.handle.net/11536/26282
ISSN: 0141-9382
DOI: 10.1016/j.displa.2010.07.003
期刊: DISPLAYS
Volume: 31
Issue: 4-5
起始頁: 191
結束頁: 195
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