標題: | Fabrication and enhanced field emission properties of novel silicon nanostructures |
作者: | Ravipati, Srikanth Kuo, Chang-Jung Shieh, Jiann Chou, Cheng-Tung Ko, Fu-Hsiang 材料科學與工程學系 材料科學與工程學系奈米科技碩博班 Department of Materials Science and Engineering Graduate Program of Nanotechnology , Department of Materials Science and Engineering |
公開日期: | 1-十二月-2010 |
摘要: | We reported the fabrication and the field emission properties of two-tier novel silicon nanostructures. First, silicon nanopillars with ordered high aspect ratio were achieved by using conventional lithographic techniques to act as the field emission sources. Second, sharp-edged well-aligned silicon nanograss was fabricated on top of the nanopillars by means of hydrogen plasma dry etching to induce the field emission characteristics. The turn-on fields were obtained as 10.5 and 14.4 V/mu m under current density of 0.01 mA/cm(2) for two-tier patterns separated by respective 5 mu m and 2 mu m spaces. The excellent field emission property from these novel nanostructures exhibited a great potential as high-performance field emitter arrays towards future nanoelectronic devices. (C) 2010 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.microrel.2010.06.005 http://hdl.handle.net/11536/26313 |
ISSN: | 0026-2714 |
DOI: | 10.1016/j.microrel.2010.06.005 |
期刊: | MICROELECTRONICS RELIABILITY |
Volume: | 50 |
Issue: | 12 |
起始頁: | 1973 |
結束頁: | 1976 |
顯示於類別: | 期刊論文 |